The Charge Device Model (CDM) likewise has fast rise times, and is used to simulate charge build-up that occurs during handling. The type of failure generated is similar to the Human Body Model (HBM), but the key difference is that the entire device is charged to the high voltage and then discharged to ground. Therefore, the ESD energy may travel paths that are different than either the HBM or Machine Model ESD test models during the discharge time. Therefore, this CDM model detects marginal design problems that may not be detected with either the machine model or the human body model. Due to the uniqueness of the test, a special test fixture is required for each package-pin type. The CDM model is currently proposed, but may not be accepted.